Abstract

Using a transmission-spectrum-based method, the refractive index of a 50 μm thick sample of poly(methyl methacrylate) (PMMA) was measured as a function of wavelength. To mitigate the effects of nonplane-parallel surfaces, the sample was measured at 16 different locations. The technique resulted in the measurement of index at several thousand independent wavelengths from 0.42 to 1.62 μm, with a relative RMS accuracy $<0.5\times {10}^{-4}$ and absolute accuracy $<2\times {10}^{-4}$.

Complex refractive index measurements of poly(methyl methacrylate) (PMMA) over the UV-VIS-NIR region

Pham Thi Hong, Hung Q. Nguyen, and H. T. M. Nghiem
Opt. Continuum 2(11) 2280-2289 (2023)

Optical recording of refractive-index patterns in doped poly-(methyl methacrylate) films

Hilmar Franke
Appl. Opt. 23(16) 2729-2733 (1984)

Humidity dependence of the birefringence in poly(methyl methacrylate) waveguides

John C. Pincenti and David L. Naylor
Appl. Opt. 33(6) 1090-1094 (1994)

Thin sample refractive index by transmission spectroscopy

Michael Brindza, Richard A. Flynn, James S. Shirk, and G. Beadie
Opt. Express 22(23) 28537-28552 (2014)

Mechanisms of femtosecond laser-induced refractive index modification of poly(methyl methacrylate)

Alexandra Baum, Patricia J. Scully, Walter Perrie, Dun Liu, and Valerio Lucarini
J. Opt. Soc. Am. B 27(1) 107-111 (2010)