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Interferometric measurement of the temperature dependence of an index of refraction: application to fused silica

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Abstract

The light reflected by an uncoated Fabry–Perot etalon presents dark rings which give a very sensitive measurement of the variations of the return optical path in the etalon. By measuring the diameters of these rings as a function of the etalon temperature T, we get a sensitive measurement of the derivative dn/dT of the index of refraction n. We have made this experiment with a fused silica etalon and we have achieved a 2% relative uncertainty on dn/dT, comparable to the uncertainty of the best experiments.

© 2010 Optical Society of America

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