Abstract
We describe the development of passive millimeter wave imaging sensors, operating at W band, that are currently being manufactured for commercial markets using standard automated assembly processes. A description of HRL Laboratories’ millimeter wave imaging chipset is presented, focusing on parameters that limit sensor performance, such as detector noise, low noise amplifier noise figure, and gain drift. We conclude with a discussion of ongoing research and development in passive millimeter wave imaging and performance improvements that can be expected for future imaging sensors.
© 2010 Optical Society of America
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