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Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo–Si multilayers

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Abstract

A Mo–Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.

© 2006 Optical Society of America

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