Abstract
Methods for accurately measuring depolarization and principal
Mueller matrix by null ellipsometry are devised. The measurement
errors obtained with these methods are analyzed, and methods to correct
for the errors are devised. The depolarization spectrum measured
directly by null ellipsometry for a sapphire slab agrees excellently
with the depolarization spectrum reduced indirectly from the retardance
spectrum measured by rotating analyzer ellipsometry and the
depolarization spectrum simulated for the retardance spread caused by a
finite bandwidth of monochromator [J. Opt. Soc. Am. A 17, 2067 (2001)]. The measured cross-polarized depolarization for
the sapphire slab is much smaller than the total
depolarization.
© 2001 Optical Society of America
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