Abstract
Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored.
© 2000 Optical Society of America
Full Article | PDF ArticleMore Like This
Thorsten Bothe, Jan Burke, and Heinz Helmers
Appl. Opt. 36(22) 5310-5316 (1997)
R. S. Sirohi, J. Burke, H. Helmers, and K. D. Hinsch
Appl. Opt. 36(23) 5787-5791 (1997)
Noe Alcalá Ochoa, Fernando Mendoza Santoyo, Carlos Pérez López, and Bernardino Barrientos
Appl. Opt. 39(28) 5138-5141 (2000)