Abstract
We have investigated the ordinate scale accuracy of ambient temperature transmittance measurements made with a Fourier transform infrared (FT-IR) spectrophotometer over the wavelength range of 2–10 µm. Two approaches are used: (1) measurements of Si wafers whose index of refraction are well known from 2 to 5 µm, in which case the FT-IR result is compared with calculated values; (2) comparison of FT-IR and laser transmittance measurements at 3.39 and 10.6 µm on nominally neutral-density filters that are free of etaloning effects. Various schemes are employed to estimate and reduce systematic error sources in both the FT-IR and laser measurements, and quantitative uncertainty analyses are performed.
© 1997 Optical Society of America
Full Article | PDF ArticleMore Like This
M. Kehrt, C. Monte, A. Steiger, A. Hoehl, J. Hollandt, H.-P. Gemünd, A. Brömel, F. Hänschke, T. May, N. Deßmann, H.-W. Hübers, R. Mientus, and E. Reck
Opt. Express 26(26) 34484-34496 (2018)
Joanne C. Zwinkels and Denis S. Gignac
Appl. Opt. 31(10) 1557-1567 (1992)
F. Manoochehri and E. Ikonen
Appl. Opt. 34(19) 3686-3692 (1995)