Abstract
A computer-controlled Mueller matrix polarimeter with dual rotating retarders is described. Bulk properties of optical materials are determined by controlling the input-polarization state and measuring the output-polarization state. The Mueller matrix of a sample is obtained from polarimetric measurements, and polarization properties, i.e., diattenuation and retardance as well as depolarization, are extracted from the Mueller matrix. Further, fundamental electro- and magneto-optical material properties such as the electro-optical tensor coefficients may be obtained from Mueller matrices measured with applied fields. The polarimeter is currently configured to operate over the 3- to 12-μm spectral region.
© 1992 Optical Society of America
Full Article | PDF ArticleMore Like This
Matthew H. Smith
Appl. Opt. 41(13) 2488-2493 (2002)
Xuemin Cheng, Maolin Li, Jialing Zhou, Hui Ma, and Qun Hao
Appl. Opt. 56(25) 7067-7074 (2017)
Yao Fu, Zhenhua Chen, Zhilie Tang, and Yanhong Ji
Appl. Opt. 60(27) 8472-8479 (2021)