Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Optical linewidth measurements using a polarizing microscope with crossed polarizers

Not Accessible

Your library or personal account may give you access

Abstract

Attention is called to an optical linewidth measurement procedure based on diffraction imagery by a polarizing microscope with crossed polarizers.

© 1990 Optical Society of America

Full Article  |  PDF Article
More Like This
Reflection Zernike phase contrast microscope

Xianggui Kong, Tiesun Feng, and Guofan Jin
Appl. Opt. 29(10) 1408-1409 (1990)

Four-port integrated optic polarization splitter

Yosi Shani, Charles H. Henry, Rodney C. Kistler, and Kenneth J. Orlowsky
Appl. Opt. 29(3) 337-339 (1990)

Sensitive dichroism measurements using eigenstate decay times

Yann Le Grand and Albert Le Floch
Appl. Opt. 29(9) 1244-1246 (1990)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (2)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (8)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved