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Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses

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Abstract

The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdSxSe1−x. Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.

© 1988 Optical Society of America

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