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New measurement system for fault location in optical waveguide devices based on an interferometric technique

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Abstract

A new measurement system for fault location in optical waveguide devices is presented. The system consists of a fiber-optic Mach-Zehnder and a bulk-type Michelson interferometers. The spatial resolution of the scatter distribution is <380 μm, which is limited by the averaging time. The minimum detectable backscattered power is −116 dB relative to the light power propagating in the waveguides. Preliminary experimental results using single-mode fibers <10 cm long are demonstrated.

© 1987 Optical Society of America

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